Series launch

Once the development is completed, we also plan and carry out the industrial series introduction of your components and devices and perform all tasks for you. In the phase of series introduction, checks and tests are carried out using automated board and device test procedures, which are primarily based on LabVIEW. These include, for example, ICT testing (in-circuit testing), boundary SCAN, programming, high-voltage testing (HV testing), burn-in testing and functional testing.

With the help of sophisticated and high-quality test procedures, we ensure that your devices as well as systems function faultlessly and flawlessly. We provide you with complete technology consulting for the optimization of product, manufacturing equipment and manufacturing processes.

To ensure the quality of the products at SYS TEC electronic for series production, a series of intermediate tests and final device tests are carried out. In this way, your assemblies are optimally brought into series production. These tests include:

• Automated Optical Inspection (AOI)
• In-Circuit Test (ICT)
• High Voltage Test (HVT)
• Insulation test
• Visual Inspection (Manual Optical Inspection - MOI)
• BurnIn test
• Function test
• Boundary SCAN

The functional test is an essential part for quality assurance and is developed by our engineers individually for your requirements. Such a test station consists of standard IO devices and power supplies such as:

• Calibrators
• Programmable power supplies
• Interface converters (e.g. USB-CAN, CAN-Ethernet, ...)
• Programmable measuring devices

A second part are the individual system components. They consist of mating points for the DUT, which cannot be realized with standard devices, and the test adapter, which contacts the DUT. These can be, among others, needle bed adapters, cable harnesses or plug-in boards. Our hardware is developed and manufactured in-house, from the circuitry to the mechanics.

Furthermore, a functional test station includes test software, which is also developed in-house. It realizes:

• encapsulation of the complex tests in easy graphical user guidance
• Visualization of the test steps
• Execution of the automated tests for reproducibility
• Data storage in the database and in log files

This enables statistical evaluations and the automated determination of key figures in real time. Test certificates can thus be generated quickly and accurately. Quality and efficiency indicators such as Mean Time Between Failure (MTBF), First Pass Yield (FPY) and target/actual time comparisons can be called up at any time. This enables early detection for maintenance needs (predictive maintenance).

With these three essential components, SYS TEC electronic has been successfully developing test systems for electronics manufacturing for years and uses them in its own series production. Thus, a modular test hardware with modular and framework-based software is available. Development times are short and the test systems are optimally adapted to the respective products. The modern, graphical operator guidance reduces the effort for the personnel to a minimum and reduces the risk for operating errors.