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EUPEC - Europäische Gesellschaft für Leistungshalbleiter mbH & Co KG

Over-current Detector
Eupec power semi-conductors are used in power-electronic applications in the range of 0.5 kW to over 1 GW. A dynamics test of the power semi-conductors is done at Eupec for final testing of power semi-conductors. The aim of using this test is to simulate the later conditions of use of the component. To do this, the test is carried out at approximately 120 ºC using a test current of up to 2,000 A at a voltage up to 2,000 V. In order to achieve these conditions, the energy is drawn from very-high-capacitance capacitor batteries. In the event of failure of a component, a phase short-circuit occurs and very high pulse currents flow. These pulse currents load the mechanical components of the measurement device to the point of destruction. Therefore, the short circuit current must be detected and limited using an overcurrent detector. SYS TEC developed and manufactured the overcurrent detector in accordance with Eupec's technical requirements. The device analyses, evaluates and reacts to the measured current flows in the test cycle. The occurrence of an overload is signaled to external components, so that they can trigger various protective functions. A micro-controller solution using analog limit value switching was selected as the hardware. Fast reaction times in the range of 15 ns to max. 50 ns are achieved using especially fast comparators in conjunction with a PLD (Programmable Logic Device). The micro-controller is parameterized using an RS-232 interface. The device has 2 or 4 different channels for evaluation purposes. An optical fiber conductor was used for secure and fast signaling of the overcurrent to the protection device. Complete software development was done at SYS TEC. In close collaboration with Eupec, optimized solutions were found for the application. The experiences gained from a multitude of customer-specific development projects are incorporated into your projects and ensure proven solutions.



This page last updated: 24. March, 2005
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